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Title:Scratch detection on stamping part based on double threshold image region growth method
Authors: Tian Hongzhi Wang Dongxing Lin Jiangang Chen Qilin 
Unit: Yantai University 
KeyWords: scratch  stamping part  dynamic threshold segmentation  region growth  structure factor 
ClassificationCode:TP391
year,vol(issue):pagenumber:2020,45(6):175-181
Abstract:

When the gray value of scratched defect area for stamping part has little difference with that of background, the traditional image segmentation method is prone to producing too much noise or the situation that the scratch features cannot be extracted. Therefore, the double threshold image region growth method based on dynamic threshold segmentation was proposed. Firstly, the collected images of stamping part were segmented by dynamic threshold with two different thresholds, and binary images with  two different thresholds were obtained. Then, the optimized binary images were dstained by region growth method combining binary images with two different thresholds. Finally, the optimized binary image after the growth was screened by area and structure factor characteristic parameters to extract the scratch defects. The experimental results show that using this method to detect the scratch defects of stamping parts meets the requirements of factory inspection and has the advantages of high detection efficiency and high accuracy.

Funds:
国家自然科学基金青年项目(11604285)
AuthorIntro:
田洪志(1994-),男,硕士研究生 E-mail:1017694473@qq.com 通讯作者:王东兴(1964-),男,博士,教授 E-mail:dxwang@ytu.edu.cn
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